Reliability measures for Hebbian-type associative memories with faulty interconnections

Pau-Choo Chung, Thomas F. Krile. Reliability measures for Hebbian-type associative memories with faulty interconnections. In IJCNN 1990, International Joint Conference on Neural Networks, San Diego, CA, USA, June 17-21, 1990. pages 847-852, IEEE, 1990. [doi]

Authors

Pau-Choo Chung

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Thomas F. Krile

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