Wei-Ho Chung, Mu-En Wu, Yeong-Luh Ueng, Yu-Hsuan Su. Seal imprint verification via feature analysis and classifications. Future Generation Comp. Syst., 101:458-466, 2019. [doi]
@article{ChungWUS19,
title = {Seal imprint verification via feature analysis and classifications},
author = {Wei-Ho Chung and Mu-En Wu and Yeong-Luh Ueng and Yu-Hsuan Su},
year = {2019},
doi = {10.1016/j.future.2019.04.027},
url = {https://doi.org/10.1016/j.future.2019.04.027},
researchr = {https://researchr.org/publication/ChungWUS19},
cites = {0},
citedby = {0},
journal = {Future Generation Comp. Syst.},
volume = {101},
pages = {458-466},
}