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Analysis of reliability and optimization of ESD protection devices supported by modeling and simulation

A. Chvála, D. Donoval, P. Beno, J. Marek, P. Pribytny, M. Molnar. Analysis of reliability and optimization of ESD protection devices supported by modeling and simulation. Microelectronics Reliability, 52(6):1031-1038, 2012. [doi]

Authors

A. Chvála

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D. Donoval

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P. Beno

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J. Marek

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P. Pribytny

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M. Molnar

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