Program analysis for bug detection using parfait: invited talk

Cristina Cifuentes, Nathan Keynes, Lian Li, Bernhard Scholz. Program analysis for bug detection using parfait: invited talk. In Germán Puebla, Germán Vidal, editors, Proceedings of the 2009 ACM SIGPLAN Symposium on Partial Evaluation and Semantics-based Program Manipulation, PEPM 2009, Savannah, GA, USA, January 19-20, 2009. pages 7-8, ACM, 2009. [doi]

@inproceedings{CifuentesKLS09,
  title = {Program analysis for bug detection using parfait: invited talk},
  author = {Cristina Cifuentes and Nathan Keynes and Lian Li and Bernhard Scholz},
  year = {2009},
  doi = {10.1145/1480945.1480947},
  url = {http://doi.acm.org/10.1145/1480945.1480947},
  tags = {program analysis, bug detection, analysis},
  researchr = {https://researchr.org/publication/CifuentesKLS09},
  cites = {0},
  citedby = {0},
  pages = {7-8},
  booktitle = {Proceedings of the 2009 ACM SIGPLAN Symposium on Partial Evaluation and Semantics-based Program Manipulation, PEPM 2009, Savannah, GA, USA, January 19-20, 2009},
  editor = {Germán Puebla and Germán Vidal},
  publisher = {ACM},
  isbn = {978-1-60558-327-3},
}