S. Cimino, A. Cester, Alessandro Paccagnella, G. Ghidini. Ionising radiation effects on MOSFET drain current. Microelectronics Reliability, 43(8):1247-1251, 2003. [doi]
@article{CiminoCPG03,
title = {Ionising radiation effects on MOSFET drain current},
author = {S. Cimino and A. Cester and Alessandro Paccagnella and G. Ghidini},
year = {2003},
doi = {10.1016/S0026-2714(03)00179-3},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00179-3},
researchr = {https://researchr.org/publication/CiminoCPG03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {8},
pages = {1247-1251},
}