Cross-sectional analysis using voxel or surface based cortical thickness methods: A comparison study

Matthew J. Clarkson, Manuel Jorge Cardoso, Marc Modat, Gerard R. Ridgway, Kelvin K. Leung, Jonathan D. Rohrer, Nick C. Fox, Sébastien Ourselin. Cross-sectional analysis using voxel or surface based cortical thickness methods: A comparison study. In Proceedings of the 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2011, March 30 - April 2, 2011, Chicago, Illinois, USA. pages 381-384, IEEE, 2011. [doi]

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