@inproceedings{Clement02:0,
  title = {Electromigration Reliability Issues in High-Performance Circuit Design (Tutorial Abstract)},
  author = {J. Joseph Clement},
  year = {2002},
  url = {http://computer.org/proceedings/isqed/1561/15610008.pdf},
  tags = {reliability, design},
  researchr = {https://researchr.org/publication/Clement02%3A0},
  cites = {0},
  citedby = {0},
  pages = {8},
  booktitle = {ISQED},
}