Tyler Cody, Laura J. Freeman. Metric Learning Improves the Ability of Combinatorial Coverage Metrics to Anticipate Classification Error. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 206-213, IEEE, 2023. [doi]
@inproceedings{CodyF23, title = {Metric Learning Improves the Ability of Combinatorial Coverage Metrics to Anticipate Classification Error}, author = {Tyler Cody and Laura J. Freeman}, year = {2023}, doi = {10.1109/ICSTW58534.2023.00045}, url = {https://doi.org/10.1109/ICSTW58534.2023.00045}, researchr = {https://researchr.org/publication/CodyF23}, cites = {0}, citedby = {0}, pages = {206-213}, booktitle = {IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023}, publisher = {IEEE}, isbn = {979-8-3503-3335-0}, }