John M. Colombi, Travis W. Odom, Warren J. Connell. A DoD Testing Profile: MBSE for Test and Evaluation Strategy. In IEEE International Systems Conference, SysCon 2023, Vancouver, BC, Canada, April 17-20, 2023. pages 1-8, IEEE, 2023. [doi]
@inproceedings{ColombiOC23,
title = {A DoD Testing Profile: MBSE for Test and Evaluation Strategy},
author = {John M. Colombi and Travis W. Odom and Warren J. Connell},
year = {2023},
doi = {10.1109/SysCon53073.2023.10131109},
url = {https://doi.org/10.1109/SysCon53073.2023.10131109},
researchr = {https://researchr.org/publication/ColombiOC23},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE International Systems Conference, SysCon 2023, Vancouver, BC, Canada, April 17-20, 2023},
publisher = {IEEE},
isbn = {978-1-6654-3994-7},
}