Markov Random Fields using complex line process: An application to Bayesian image restoration

Stefania Colonnese, Stefano Rinauro, Gaetano Scarano. Markov Random Fields using complex line process: An application to Bayesian image restoration. In European Workshop on Visual Information Processing, EUVIP 2011, Paris, France, July 4-6, 2011. pages 30-35, IEEE, 2011. [doi]

Authors

Stefania Colonnese

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Stefano Rinauro

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Gaetano Scarano

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