Fast Maximum Likelihood Scale Parameter Estimation From Histogram Measurements

Stefania Colonnese, Stefano Rinauro, Gaetano Scarano. Fast Maximum Likelihood Scale Parameter Estimation From Histogram Measurements. IEEE Signal Process. Lett., 18(8):474-477, 2011. [doi]

Authors

Stefania Colonnese

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Stefano Rinauro

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Gaetano Scarano

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