3D structure simulation and proceeding to extract mobility parameters for FinFETs varying channel length - researchr publication authors

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J. E. Conde, Antonio Cerdeira. 3D structure simulation and proceeding to extract mobility parameters for FinFETs varying channel length. In Proceedings of the 7th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2010 (Formerly known as ICEEE), September 8-10, 2010, Tuxtla Gutierrez, Mexico. pages 591-594, IEEE, 2010. [doi]

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