Cristian Constantinescu. Impact of Deep Submicron Technology on Dependability of VLSI Circuits. In 2002 International Conference on Dependable Systems and Networks (DSN 2002), 23-26 June 2002, Bethesda, MD, USA, Proceedings. pages 205-209, IEEE Computer Society, 2002. [doi]
@inproceedings{Constantinescu02, title = {Impact of Deep Submicron Technology on Dependability of VLSI Circuits}, author = {Cristian Constantinescu}, year = {2002}, url = {http://computer.org/proceedings/dsn/1597/15970205abs.htm}, researchr = {https://researchr.org/publication/Constantinescu02}, cites = {0}, citedby = {0}, pages = {205-209}, booktitle = {2002 International Conference on Dependable Systems and Networks (DSN 2002), 23-26 June 2002, Bethesda, MD, USA, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-7695-1597-5}, }