Cristian Constantinescu. Trends and Challenges in VLSI Circuit Reliability. IEEE Micro, 23(4):14-19, 2003. [doi]
@article{Constantinescu03,
title = {Trends and Challenges in VLSI Circuit Reliability},
author = {Cristian Constantinescu},
year = {2003},
url = {http://csdl.computer.org/comp/mags/mi/2003/04/m4014abs.htm},
tags = {reliability},
researchr = {https://researchr.org/publication/Constantinescu03},
cites = {0},
citedby = {0},
journal = {IEEE Micro},
volume = {23},
number = {4},
pages = {14-19},
}