A new methodology for the statistical analysis of VLSI CMOS circuits and its application to flash memories - researchr publication authors

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Massimo Conti, Paolo Crippa, Simone Orcioni, M. Pesare, Claudio Turchetti, Loris Vendrame, S. Lucherini. A new methodology for the statistical analysis of VLSI CMOS circuits and its application to flash memories. In ISCAS (4). pages 89-92, 2002. [doi]

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