Structural In-Field Diagnosis for Random Logic Circuits - researchr publication authors

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Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein. Structural In-Field Diagnosis for Random Logic Circuits. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 111-116, IEEE Computer Society, 2011. [doi]

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