Diagnosis of multiple faults with highly compacted test responses

Alejandro Cook, Hans-Joachim Wunderlich. Diagnosis of multiple faults with highly compacted test responses. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]

@inproceedings{CookW14-0,
  title = {Diagnosis of multiple faults with highly compacted test responses},
  author = {Alejandro Cook and Hans-Joachim Wunderlich},
  year = {2014},
  doi = {10.1109/ETS.2014.6847796},
  url = {http://dx.doi.org/10.1109/ETS.2014.6847796},
  researchr = {https://researchr.org/publication/CookW14-0},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014},
  editor = {Giorgio Di Natale},
  publisher = {IEEE},
}