Peter Coppens, Guido Vanhorebeek, Eddy De Backer. Correlation between predicted cause of SRAM failures and in-line defect data. Microelectronics Reliability, 41(1):53-57, 2001. [doi]
@article{CoppensVB01,
title = {Correlation between predicted cause of SRAM failures and in-line defect data},
author = {Peter Coppens and Guido Vanhorebeek and Eddy De Backer},
year = {2001},
doi = {10.1016/S0026-2714(00)00105-0},
url = {http://dx.doi.org/10.1016/S0026-2714(00)00105-0},
tags = {data-flow},
researchr = {https://researchr.org/publication/CoppensVB01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {1},
pages = {53-57},
}