David Coppit, Jinlin Yang, Sarfraz Khurshid, Wei Le, Kevin J. Sullivan. Software Assurance by Bounded Exhaustive Testing. IEEE Trans. Software Eng., 31(4):328-339, 2005. [doi]
@article{CoppitYKLS05,
title = {Software Assurance by Bounded Exhaustive Testing},
author = {David Coppit and Jinlin Yang and Sarfraz Khurshid and Wei Le and Kevin J. Sullivan},
year = {2005},
doi = {10.1109/TSE.2005.52},
url = {http://dx.doi.org/10.1109/TSE.2005.52},
tags = {testing},
researchr = {https://researchr.org/publication/CoppitYKLS05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {31},
number = {4},
pages = {328-339},
}