A Genetic Algorithm for Automatic Generation of Test Logic for Digital Circuits

Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda. A Genetic Algorithm for Automatic Generation of Test Logic for Digital Circuits. In ICTAI. pages 10-16, 1996.

Authors

Fulvio Corno

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Paolo Prinetto

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Matteo Sonza Reorda

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