A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits

Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda. A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits. In Heather M. Liddell, Adrian Colbrook, Louis O. Hertzberger, Peter M. A. Sloot, editors, High-Performance Computing and Networking, International Conference and Exhibition, HPCN Europe 1996, Brussels, Belgium, April 15-19, 1996, Proceedings. Volume 1067 of Lecture Notes in Computer Science, pages 454-459, Springer, 1996.

@inproceedings{CornoPRR96:1,
  title = {A Parallel Genetic Algorithm for Automatic Generation of Test Sequences for Digital Circuits},
  author = {Fulvio Corno and Paolo Prinetto and Maurizio Rebaudengo and Matteo Sonza Reorda},
  year = {1996},
  tags = {testing},
  researchr = {https://researchr.org/publication/CornoPRR96%3A1},
  cites = {0},
  citedby = {0},
  pages = {454-459},
  booktitle = {High-Performance Computing and Networking, International Conference and Exhibition, HPCN Europe 1996, Brussels, Belgium, April 15-19, 1996, Proceedings},
  editor = {Heather M. Liddell and Adrian Colbrook and Louis O. Hertzberger and Peter M. A. Sloot},
  volume = {1067},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-61142-8},
}