Low Power BIST via Non-Linear Hybrid Cellular Automata

Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda, Giovanni Squillero, Massimo Violante. Low Power BIST via Non-Linear Hybrid Cellular Automata. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 29-34, IEEE Computer Society, 2000. [doi]

Authors

Fulvio Corno

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Maurizio Rebaudengo

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Matteo Sonza Reorda

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Giovanni Squillero

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Massimo Violante

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