An evolutionary algorithm for reducing integrated-circuit test application time - researchr publication authors

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Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero. An evolutionary algorithm for reducing integrated-circuit test application time. In Proceedings of the 2002 ACM Symposium on Applied Computing (SAC), March 10-14, 2002, Madrid, Spain. pages 608-612, ACM, 2002. [doi]

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