Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{CoyetteEDVG16-0,
title = {Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis},
author = {Anthony Coyette and Baris Esen and Wim Dobbelaere and Ronny Vanhooren and Georges G. E. Gielen},
year = {2016},
doi = {10.1109/TEST.2016.7805867},
url = {http://dx.doi.org/10.1109/TEST.2016.7805867},
researchr = {https://researchr.org/publication/CoyetteEDVG16-0},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}