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Sensitivity of reliability growth models to operational profile errors

Adalberto Nobiato Crespo, Paolo Matrella, Alberto Pasquini. Sensitivity of reliability growth models to operational profile errors. In Seventh International Symposium on Software Reliability Engineering, ISSRE 1996, White Plains, NY, USA, October 30, 1996-Nov. 2, 1996. pages 35-44, IEEE Computer Society, 1996. [doi]

Authors

Adalberto Nobiato Crespo

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Paolo Matrella

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Alberto Pasquini

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