Innovative Practices Session: Recent Developments in IEEE Draft Standards P1838a & P3164, and Analog Soft Defects - researchr publication authors

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Adam Cron, Sohrab Aftabjahani, Senthil Singaravelu. Innovative Practices Session: Recent Developments in IEEE Draft Standards P1838a & P3164, and Analog Soft Defects. In 44th IEEE VLSI Test Symposium, VTS 2026, Napa, CA, USA, April 27-29, 2026. pages 1, IEEE, 2026. [doi]

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