An application of machine learning and statistics to defect detection

Rita Cucchiara, Paola Mello, Massimo Piccardi, Fabrizio Riguzzi. An application of machine learning and statistics to defect detection. Intell. Data Anal., 5(2):151-164, 2001. [doi]

Authors

Rita Cucchiara

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Paola Mello

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Massimo Piccardi

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Fabrizio Riguzzi

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