Intellectual property authentication by watermarking scan chain in design-for-testability flow

Aijiao Cui, Chip-Hong Chang. Intellectual property authentication by watermarking scan chain in design-for-testability flow. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 2645-2648, IEEE, 2008. [doi]

@inproceedings{CuiC08,
  title = {Intellectual property authentication by watermarking scan chain in design-for-testability flow},
  author = {Aijiao Cui and Chip-Hong Chang},
  year = {2008},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4541329&arnumber=4542000&count=904&index=670},
  tags = {watermarking, testing, data-flow, design},
  researchr = {https://researchr.org/publication/CuiC08},
  cites = {0},
  citedby = {0},
  pages = {2645-2648},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA},
  publisher = {IEEE},
}