Alessandro Cultrera, Luca Callegaro. Electrical Resistance Tomography of Conductive Thin Films. IEEE T. Instrumentation and Measurement, 65(9):2101-2107, 2016. [doi]
@article{CultreraC16,
title = {Electrical Resistance Tomography of Conductive Thin Films},
author = {Alessandro Cultrera and Luca Callegaro},
year = {2016},
doi = {10.1109/TIM.2016.2570127},
url = {http://dx.doi.org/10.1109/TIM.2016.2570127},
researchr = {https://researchr.org/publication/CultreraC16},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {65},
number = {9},
pages = {2101-2107},
}