John P. Cunningham, Krishna V. Shenoy, Maneesh Sahani. Fast Gaussian process methods for point process intensity estimation. In William W. Cohen, Andrew McCallum, Sam T. Roweis, editors, Machine Learning, Proceedings of the Twenty-Fifth International Conference (ICML 2008), Helsinki, Finland, June 5-9, 2008. Volume 307 of ACM International Conference Proceeding Series, pages 192-199, ACM, 2008. [doi]
@inproceedings{CunninghamSS08,
title = {Fast Gaussian process methods for point process intensity estimation},
author = {John P. Cunningham and Krishna V. Shenoy and Maneesh Sahani},
year = {2008},
doi = {10.1145/1390156.1390181},
url = {http://doi.acm.org/10.1145/1390156.1390181},
researchr = {https://researchr.org/publication/CunninghamSS08},
cites = {0},
citedby = {0},
pages = {192-199},
booktitle = {Machine Learning, Proceedings of the Twenty-Fifth International Conference (ICML 2008), Helsinki, Finland, June 5-9, 2008},
editor = {William W. Cohen and Andrew McCallum and Sam T. Roweis},
volume = {307},
series = {ACM International Conference Proceeding Series},
publisher = {ACM},
isbn = {978-1-60558-205-4},
}