L. Curos, T. Dubois, G. Mejecaze, F. Puybaret, Jean-Michel Vinassa. Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection. In 2020 IEEE International Conference on Industrial Technology, ICIT 2020, Buenos Aires, Argentina, February 26-28, 2020. pages 511-516, IEEE, 2020. [doi]
@inproceedings{CurosDMPV20,
title = {Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection},
author = {L. Curos and T. Dubois and G. Mejecaze and F. Puybaret and Jean-Michel Vinassa},
year = {2020},
doi = {10.1109/ICIT45562.2020.9067183},
url = {https://doi.org/10.1109/ICIT45562.2020.9067183},
researchr = {https://researchr.org/publication/CurosDMPV20},
cites = {0},
citedby = {0},
pages = {511-516},
booktitle = {2020 IEEE International Conference on Industrial Technology, ICIT 2020, Buenos Aires, Argentina, February 26-28, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5754-2},
}