Krzysztof Czarnecki, Steven She, Andrzej Wasowski. Sample Spaces and Feature Models: There and Back Again. In Software Product Lines, 12th International Conference, SPLC 2008, Limerick, Ireland, September 8-12, 2008, Proceedings. pages 22-31, IEEE Computer Society, 2008. [doi]
No references recorded for this publication.
No citations of this publication recorded.