Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing

Adam Dachowicz, Mikhail J. Atallah, Jitesh H. Panchal. Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing. J. Comput. Inf. Sci. Eng., 20(5), 2020. [doi]

Authors

Adam Dachowicz

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Mikhail J. Atallah

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Jitesh H. Panchal

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