Peter Dahlgren, Peter Lidén. A fault model for switch-level simulation of gate-to-drain shorts. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 414-421, IEEE Computer Society, 1996. [doi]
@inproceedings{DahlgrenL96,
title = {A fault model for switch-level simulation of gate-to-drain shorts},
author = {Peter Dahlgren and Peter Lidén},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040414abs.htm},
researchr = {https://researchr.org/publication/DahlgrenL96},
cites = {0},
citedby = {0},
pages = {414-421},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}