Wei Dai, Daniel Berleant. Discovering Limitations of Image Quality Assessments with Noised Deep Learning Image Sets. In Shusaku Tsumoto, Yukio Ohsawa, Lei Chen 0002, Dirk Van den Poel, Xiaohua Hu 0001, Yoichi Motomura, Takuya Takagi, Lingfei Wu, Ying Xie, Akihiro Abe, Vijay Raghavan 0001, editors, IEEE International Conference on Big Data, Big Data 2022, Osaka, Japan, December 17-20, 2022. pages 3735-3744, IEEE, 2022. [doi]
@inproceedings{DaiB22,
title = {Discovering Limitations of Image Quality Assessments with Noised Deep Learning Image Sets},
author = {Wei Dai and Daniel Berleant},
year = {2022},
doi = {10.1109/BigData55660.2022.10020507},
url = {https://doi.org/10.1109/BigData55660.2022.10020507},
researchr = {https://researchr.org/publication/DaiB22},
cites = {0},
citedby = {0},
pages = {3735-3744},
booktitle = {IEEE International Conference on Big Data, Big Data 2022, Osaka, Japan, December 17-20, 2022},
editor = {Shusaku Tsumoto and Yukio Ohsawa and Lei Chen 0002 and Dirk Van den Poel and Xiaohua Hu 0001 and Yoichi Motomura and Takuya Takagi and Lingfei Wu and Ying Xie and Akihiro Abe and Vijay Raghavan 0001},
publisher = {IEEE},
isbn = {978-1-6654-8045-1},
}