Zhenyu Dai, Mei-Hwa Chen. Automatic Test Generation for Database-Driven Applications. In Proceedings of the Nineteenth International Conference on Software Engineering & Knowledge Engineering (SEKE 2007), Boston, Massachusetts, USA, July 9-11, 2007. pages 117-122, Knowledge Systems Institute Graduate School, 2007.
@inproceedings{DaiC07:2,
title = {Automatic Test Generation for Database-Driven Applications},
author = {Zhenyu Dai and Mei-Hwa Chen},
year = {2007},
tags = {testing, database},
researchr = {https://researchr.org/publication/DaiC07%3A2},
cites = {0},
citedby = {0},
pages = {117-122},
booktitle = {Proceedings of the Nineteenth International Conference on Software Engineering & Knowledge Engineering (SEKE 2007), Boston, Massachusetts, USA, July 9-11, 2007},
publisher = {Knowledge Systems Institute Graduate School},
isbn = {1-891706-20-9},
}