Improvement of High-Value Capacitance Measurement

Dongxue Dai, Xiaobing He, Wei Wang, Yanqiang Li. Improvement of High-Value Capacitance Measurement. IEEE T. Instrumentation and Measurement, 62(6):1795-1800, 2013. [doi]

Authors

Dongxue Dai

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Xiaobing He

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Wei Wang

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Yanqiang Li

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