Mingzhi Dai, Mingming Li, Guodong Wu, Li Li, Huang Jin. Transient current mechanism of lead zirconate titanate capacitors sputtered on La::0.65::Sr::0.35::MnO::3::. Microelectronics Reliability, 51(5):925-926, 2011. [doi]
@article{DaiLWLJ11,
title = {Transient current mechanism of lead zirconate titanate capacitors sputtered on La::0.65::Sr::0.35::MnO::3::},
author = {Mingzhi Dai and Mingming Li and Guodong Wu and Li Li and Huang Jin},
year = {2011},
doi = {10.1016/j.microrel.2011.01.003},
url = {http://dx.doi.org/10.1016/j.microrel.2011.01.003},
researchr = {https://researchr.org/publication/DaiLWLJ11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {5},
pages = {925-926},
}