Yuan-Shun Dai, Min Xie, Kim-Leng Poh. Modeling and analysis of correlated software failures of multiple types. IEEE Transactions on Reliability, 54(1):100-106, 2005. [doi]
@article{DaiXP05,
title = {Modeling and analysis of correlated software failures of multiple types},
author = {Yuan-Shun Dai and Min Xie and Kim-Leng Poh},
year = {2005},
doi = {10.1109/TR.2004.841709},
url = {http://dx.doi.org/10.1109/TR.2004.841709},
tags = {modeling, analysis},
researchr = {https://researchr.org/publication/DaiXP05},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {54},
number = {1},
pages = {100-106},
}