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Repetitive high peak current pulsed discharge film-capacitor reliability testing

H. Q. S. Dang, M. R. Corfield, Alberto Castellazzi, C. M. Johnson, P. W. Wheeler. Repetitive high peak current pulsed discharge film-capacitor reliability testing. Microelectronics Reliability, 52(9-10):2301-2305, 2012. [doi]

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