Ehab Anis Daoud, Nicola Nicolici. On Bypassing Blocking Bugs during Post-Silicon Validation. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 69-74, IEEE Computer Society, 2008. [doi]
@inproceedings{DaoudN08,
title = {On Bypassing Blocking Bugs during Post-Silicon Validation},
author = {Ehab Anis Daoud and Nicola Nicolici},
year = {2008},
doi = {10.1109/ETS.2008.29},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.29},
researchr = {https://researchr.org/publication/DaoudN08},
cites = {0},
citedby = {0},
pages = {69-74},
booktitle = {13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3150-2},
}