Abhijit Das 0001, Saurabh Atreya, Aritra Mukherjee, Matej Vitek, Haiqing Li, Caiyong Wang, Guangzhe Zhao, Fadi Boutros, Patrick Siebke, Jan Niklas Kolf, Naser Damer, Sun Ye, Lu Hexin, Fan Aobo, You-Sheng, Sabari Nathan, R. Suganya, R. S. Rampriya, Geetanjali Sharma, P. Priyanka, Aditya Nigam, Peter Peer, Umapada Pal 0001, Vitomir Struc. Sclera Segmentation and Joint Recognition Benchmarking Competition: SSRBC 2023. In IEEE International Joint Conference on Biometrics, IJCB 2023, Ljubljana, Slovenia, September 25-28, 2023. pages 1-10, IEEE, 2023. [doi]
@inproceedings{DasAMVLWZBSKDYHASNSRSPNPPS23,
title = {Sclera Segmentation and Joint Recognition Benchmarking Competition: SSRBC 2023},
author = {Abhijit Das 0001 and Saurabh Atreya and Aritra Mukherjee and Matej Vitek and Haiqing Li and Caiyong Wang and Guangzhe Zhao and Fadi Boutros and Patrick Siebke and Jan Niklas Kolf and Naser Damer and Sun Ye and Lu Hexin and Fan Aobo and You-Sheng and Sabari Nathan and R. Suganya and R. S. Rampriya and Geetanjali Sharma and P. Priyanka and Aditya Nigam and Peter Peer and Umapada Pal 0001 and Vitomir Struc},
year = {2023},
doi = {10.1109/IJCB57857.2023.10448601},
url = {https://doi.org/10.1109/IJCB57857.2023.10448601},
researchr = {https://researchr.org/publication/DasAMVLWZBSKDYHASNSRSPNPPS23},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Joint Conference on Biometrics, IJCB 2023, Ljubljana, Slovenia, September 25-28, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3726-6},
}