Efficient post-silicon validation via segmentation of process variation envelope - Global vs local variations - researchr publication authors

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Prasanjeet Das, Sandeep K. Gupta. Efficient post-silicon validation via segmentation of process variation envelope - Global vs local variations. In Fifteenth International Symposium on Quality Electronic Design, ISQED 2014, Santa Clara, CA, USA, March 3-5, 2014. pages 115-122, IEEE, 2014. [doi]

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