Amitabh Das, Ünal Koçabas, Ahmad-Reza Sadeghi, Ingrid Verbauwhede. PUF-based secure test wrapper design for cryptographic SoC testing. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 866-869, IEEE, 2012. [doi]
@inproceedings{DasKSV12,
title = {PUF-based secure test wrapper design for cryptographic SoC testing},
author = {Amitabh Das and Ünal Koçabas and Ahmad-Reza Sadeghi and Ingrid Verbauwhede},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176618},
researchr = {https://researchr.org/publication/DasKSV12},
cites = {0},
citedby = {0},
pages = {866-869},
booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012},
editor = {Wolfgang Rosenstiel and Lothar Thiele},
publisher = {IEEE},
isbn = {978-1-4577-2145-8},
}