Double resonant controller for fast atomic force microscopy

Sajal K. Das, Hemanshu Roy Pota, Ian R. Petersen. Double resonant controller for fast atomic force microscopy. In 9th Asian Control Conference, ASCC 2013, Istanbul, Turkey, June 23-26, 2013. pages 1-6, IEEE, 2013. [doi]

@inproceedings{DasPP13-2,
  title = {Double resonant controller for fast atomic force microscopy},
  author = {Sajal K. Das and Hemanshu Roy Pota and Ian R. Petersen},
  year = {2013},
  doi = {10.1109/ASCC.2013.6606209},
  url = {https://doi.org/10.1109/ASCC.2013.6606209},
  researchr = {https://researchr.org/publication/DasPP13-2},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {9th Asian Control Conference, ASCC 2013, Istanbul, Turkey, June 23-26, 2013},
  publisher = {IEEE},
  isbn = {978-1-4673-5767-8},
}