Tejasvi Das, Clyde Washburn, P. R. Mukund, Steve Howard, Ken Paradis, Jung-Geau Jang, Jan Kolnik, Jeff Burleson. Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 295-300, IEEE Computer Society, 2005. [doi]
@inproceedings{DasWMHPJKB05,
title = {Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs},
author = {Tejasvi Das and Clyde Washburn and P. R. Mukund and Steve Howard and Ken Paradis and Jung-Geau Jang and Jan Kolnik and Jeff Burleson},
year = {2005},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2005/2264/00/22640295abs.htm},
researchr = {https://researchr.org/publication/DasWMHPJKB05},
cites = {0},
citedby = {0},
pages = {295-300},
booktitle = {18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2264-5},
}