Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Aurobindo Dasgupta, Ramesh Karri. Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing. In DAC. pages 819-824, 1996. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Electromigration Reliability Enhancement via Bus Activity DistributionAurobindo Dasgupta, Ramesh Karri. dac 1996: 353-356 [doi]
The following publications are possibly variants of this publication: