Calibration of on-chip thermal sensors using process monitoring circuits

Basab Datta, Wayne P. Burleson. Calibration of on-chip thermal sensors using process monitoring circuits. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 461-467, IEEE, 2010. [doi]

Authors

Basab Datta

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Wayne P. Burleson

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