Scott Davidson. Is I::DDQ:: Yield Loss Inevitable?. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 572-579, IEEE Computer Society, 1994.
@inproceedings{Davidson94,
title = {Is I::DDQ:: Yield Loss Inevitable?},
author = {Scott Davidson},
year = {1994},
researchr = {https://researchr.org/publication/Davidson94},
cites = {0},
citedby = {0},
pages = {572-579},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}