Joint statistical properties of RMS height and correlation length derived from multisite 1-m roughness measurements

Malcolm W. J. Davidson, Francesco Mattia, Giuseppe Satalino, Niko E. C. Verhoest, Thuy Le Toan, Maurice Borgeaud, Jérôme M. B. Louis, Evert Attema. Joint statistical properties of RMS height and correlation length derived from multisite 1-m roughness measurements. IEEE T. Geoscience and Remote Sensing, 41(7):1651-1658, 2003. [doi]

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